Clara Vision
91300 Massy-France
info@claravision.com
Tel :+(33)-1-69-86-01-30
Fax :+(33)-1-69-28-24-61
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Powerful databasing, integrated networking and a wide range of quantification, clustering and
statistical tools
Ever since the first release of GelCompar in 1991, Applied Maths has produced state-of-the-art software
for the analysis and comparison of electrophoresis patterns. Along with the success and expansion of
electrophoresis techniques in various application fields, GelCompar II has been continuously
updated and extended to be compatible with the latest developments and the ever growing amounts
of information. The relational database concept in GelCompar II makes it possible to link multiple
electrophoresis fingerprints to the strains or samples studied, and generate multiphasic groupings
and identifications with databases of unlimited size.
Gelcompar2.pdf
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GelCompar II Basic Software
Image processing and normalization. Input of 8-bit, 12-bit and 16-bit TIFF images, densitograms,
and chromatograms of unlimited filesize. Automatic lane finding on images for all types of gels.
Gelstrip borders and tracking splines adjustable for each individual lane.
Automated and manual alignment by pattern recognition using external reference patterns.
Approved band-search algorithms with adjustable sensitivity for shoulder and double-band finding
based on curve. Possibility to find and mark uncertain bands. Quantification of molecular sizes
or any other metric unit using linear and logarithmic. Accurate expression of protein or nucleic
acid quantities or concentrations based on cubic spline regression using known calibration bands.
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Cluster Analysis and Phylogeny
Creation of dendrograms including up to 10,000 database entries using product-moment Pearson correlation,
cosine correlation, Dice or Nei and Li, Jaccard, Jeffrey's X, Ochiai and area sensitive relatives.
Unweighted pair-grouping (UPGMA), complete linkage (furthest neighbor), single linkage (nearest neighbor),
Ward or Neighbor Joining clustering. Adjustable trace-to-trace optimization and tolerance settings for
banding patterns. Statistical determination of most justified tolerance settings for banding patterns.
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